New approach for measuring lateral diffusion in Langmuir monolayers by scanning electrochemical microscopy (SECM): Theory and application

Journal of Physical Chemistry B

Volumn 105, Issue 45, 2001, Pages 11120-11130

  Zhang, Jie ^a   Slevin, Christopher J ^a   Morton, Colin ^a   Scott, Peter ^a   Walton, David J ^b   Unwin, Patrick R ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b Faculty of Engineering and Computing   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

LANGMUIR MONOLAYERS;

DIFFUSION; ELECTROLYSIS; ELECTRONS; INTERFACES (MATERIALS); MICROELECTRODES; MONOLAYERS;

LANGMUIR BLODGETT FILMS;

EID: 0035892162     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp004592j     Document Type: Article

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