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Volumn 808, Issue , 2004, Pages 365-370

Optical and electronic characterization of a-SiGe:H thin films prepared by a novel hollow cathode deposition technique

Author keywords

[No Author keywords available]

Indexed keywords

CATHODES; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SECONDARY ION MASS SPECTROMETRY; SPECTROSCOPIC ANALYSIS; THIN FILMS;

EID: 12744259337     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-808-a9.4     Document Type: Conference Paper
Times cited : (1)

References (24)
  • 6
    • 12744266284 scopus 로고    scopus 로고
    • NREL world wide web page, http://www.nrel.gov/ncpv/pvmenu.cgi?site=ncpv&idx= 1&body=world.html
  • 13
    • 12744257789 scopus 로고    scopus 로고
    • Deposition of a-Ge:H films by a hollow cathode plasma-jet sputtering system
    • Oct. San Francisco
    • G. Pribil, R.J. Soukup, and N.J. Ianno, "Deposition of a-Ge:H Films by a Hollow Cathode Plasma-Jet Sputtering System," presented at the American Vacuum Symposium, Oct. 2001, San Francisco.
    • (2001) American Vacuum Symposium
    • Pribil, G.1    Soukup, R.J.2    Ianno, N.J.3
  • 22
    • 12744275845 scopus 로고    scopus 로고
    • NREL, private communication
    • H. Mahan, NREL, private communication.
    • Mahan, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.