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Volumn 808, Issue , 2004, Pages 41-46

Metastability in undoped microcrystalline silicon thin films deposited by HWCVD

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; CHEMICAL VAPOR DEPOSITION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS;

EID: 12744258041     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-808-a9.10     Document Type: Conference Paper
Times cited : (5)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.