메뉴 건너뛰기




Volumn 49, Issue 3, 2005, Pages 485-489

A design oriented charge-based current model for symmetric DG MOSFET and its correlation with the EKV formalism

Author keywords

Double gate; EKV; MOSFET; Transconductance

Indexed keywords

APPROXIMATION THEORY; ELECTRIC CHARGE; FERMI LEVEL; LOGIC GATES; POISSON EQUATION; QUANTUM THEORY; SEMICONDUCTING SILICON; THIN FILMS; TRANSCONDUCTANCE;

EID: 12344336837     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2004.11.013     Document Type: Article
Times cited : (163)

References (12)
  • 1
    • 0035694506 scopus 로고    scopus 로고
    • Analytic solutions of charge and capacitance in symmetric and asymmetric double-gate MOSFETs
    • Y. Taur Analytic solutions of charge and capacitance in symmetric and asymmetric double-gate MOSFETs IEEE Trans Electron Dev 48 2001 2861
    • (2001) IEEE Trans Electron Dev , vol.48 , pp. 2861
    • Taur, Y.1
  • 2
    • 1342286939 scopus 로고    scopus 로고
    • A continuous, analytic drain-current model for DG MOSFETs
    • Y. Taur, X. Liang, W. Wang, and H. Lu A continuous, analytic drain-current model for DG MOSFETs IEEE Electron Dev Lett 25 2004 107
    • (2004) IEEE Electron Dev Lett , vol.25 , pp. 107
    • Taur, Y.1    Liang, X.2    Wang, W.3    Lu, H.4
  • 3
    • 0036475197 scopus 로고    scopus 로고
    • Analytical modeling of quantization and volume inversion in thin Si-film DG MOSFETs
    • L. Ge, and J.G. Fossum Analytical modeling of quantization and volume inversion in thin Si-film DG MOSFETs IEEE Trans. Electron Dev 49 2002 287
    • (2002) IEEE Trans. Electron Dev , vol.49 , pp. 287
    • Ge, L.1    Fossum, J.G.2
  • 4
    • 0033169528 scopus 로고    scopus 로고
    • A compact double-gate MOSFET model comprising quantum-mechanical and nonstatic effects
    • G. Baccarani, and S. Reggiani A compact double-gate MOSFET model comprising quantum-mechanical and nonstatic effects IEEE Trans. Electron Dev 46 1999 1656
    • (1999) IEEE Trans. Electron Dev , vol.46 , pp. 1656
    • Baccarani, G.1    Reggiani, S.2
  • 5
    • 0013084791 scopus 로고    scopus 로고
    • The foundations of the EKV MOS transistor charge-based model, Workshop on Compact Modeling (WCM)
    • San Juan, Puerto Rico, April
    • Enz C, Bucher M, Porret AS, Sallese J-M, Krummenacher F. The foundations of the EKV MOS transistor charge-based model, Workshop on Compact Modeling (WCM). In: Int Conf Modeling and Simulation of Microsystems, San Juan, Puerto Rico, April 2002. p. 666-9. Available from: http://legwww.epfl.ch/ekv/
    • (2002) Int Conf Modeling and Simulation of Microsystems , pp. 666-669
    • Enz, C.1    Bucher, M.2    Porret, A.S.3    Sallese, J.-M.4    Krummenacher, F.5
  • 6
    • 0030241117 scopus 로고    scopus 로고
    • A Gm/Id based methodology for the design of CMOS analog circuits and its application to the synthesis of a silicon on insulator micropower ETA
    • M. Sylveira, D. Flandre, and P.G.A. Gespers A Gm/Id based methodology for the design of CMOS analog circuits and its application to the synthesis of a silicon on insulator micropower ETA IEEE J Solid State Circ 31 9 1996
    • (1996) IEEE J Solid State Circ , vol.31 , Issue.9
    • Sylveira, M.1    Flandre, D.2    Gespers, P.G.A.3
  • 7
    • 0042752026 scopus 로고    scopus 로고
    • Design-oriented characterization of CMOS over the continuum of inversion level and channel length
    • Kaslik, Lebanon, 17-20 December
    • Binkley DM, Bucher M, Foty D. Design-oriented characterization of CMOS over the continuum of inversion level and channel length. In: Proc 7th IEEE Int Conf on Electronics, Circuits and Systems ICECS'2k, Kaslik, Lebanon, 17-20 December 2000. p. 161-4
    • (2000) Proc 7th IEEE Int Conf on Electronics, Circuits and Systems ICECS'2k , pp. 161-164
    • Binkley, D.M.1    Bucher, M.2    Foty, D.3
  • 9
    • 0041926455 scopus 로고    scopus 로고
    • Comparison of a BSIM3V3 and EKV MOSFET model for a 0.5_m CMOS process and implications for analog circuit design
    • S.C. Terry, J.M. Rochelle, D.M. Binkley, B.J. Blalock, D.P. Foty, and M. Bucher Comparison of a BSIM3V3 and EKV MOSFET model for a 0.5_m CMOS process and implications for analog circuit design IEEE Trans Nucl Sci 50 2003 915
    • (2003) IEEE Trans Nucl Sci , vol.50 , pp. 915
    • Terry, S.C.1    Rochelle, J.M.2    Binkley, D.M.3    Blalock, B.J.4    Foty, D.P.5    Bucher, M.6
  • 10
    • 0029342165 scopus 로고
    • An analytical MOS model valid in all regions of operation and dedicated to low-voltage and low-current applications
    • C. Enz, F. Krummenacher, and E. Vittoz An analytical MOS model valid in all regions of operation and dedicated to low-voltage and low-current applications J Analog Integrat Circ Signal Process 8 July 1995 83 114
    • (1995) J Analog Integrat Circ Signal Process , vol.8 , pp. 83-114
    • Enz, C.1    Krummenacher, F.2    Vittoz, E.3
  • 11
    • 0037395540 scopus 로고    scopus 로고
    • Inversion charge linearisation in MOSFET modelling and rigorous derivation of the EKV compact model
    • J.M. Sallese, M. Bucher, K. Krummenacher, and P. Fazan Inversion charge linearisation in MOSFET modelling and rigorous derivation of the EKV compact model Solid State Electron 47 2003 667 683
    • (2003) Solid State Electron , vol.47 , pp. 667-683
    • Sallese, J.M.1    Bucher, M.2    Krummenacher, K.3    Fazan, P.4
  • 12
    • 0033727761 scopus 로고    scopus 로고
    • A Novel approach to charge-based non-quasi-static model of the MOS transistor valid in all modes of operation
    • J.-M. Sallese, and A.-S. Porret A Novel approach to charge-based non-quasi-static model of the MOS transistor valid in all modes of operation Solid State Electron 44 6 2000 887 894
    • (2000) Solid State Electron , vol.44 , Issue.6 , pp. 887-894
    • Sallese, J.-M.1    Porret, A.-S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.