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Volumn 50, Issue 4 II, 2003, Pages 915-920

Comparison of a BSIM3V3 and EKV MOSFET model for a 0.5 μm CMOS process and implications for analog circuit design

Author keywords

Analog circuit design; BSIM3V3; CMOS modeling; EKV 2.6; Inversion coefficient; Transconductnce efficiency

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; MOSFET DEVICES; VOLTAGE MEASUREMENT;

EID: 0041926455     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2003.814588     Document Type: Conference Paper
Times cited : (36)

References (17)
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  • 2
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    • Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers
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    • M. Manghisoni, L. Ratti, V. Re, and V. Speziali, "Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers," IEEE Trans. Nucl. Sci., vol. 49, pp. 1281-1286, June 2002.
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  • 5
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    • MOSFET modeling and circuit design: A methodology for transistor level analog CMOS design
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    • Design oriented characterization of CMOS over the continuum of inversion level and channel length
    • Kaslik, Lebanon, Dec.
    • D. M. Binkley, M. Bucher, and D. P. Foty, "Design oriented characterization of CMOS over the continuum of inversion level and channel length," in Proc. 7th Int. Conf. Electronics, Circuits, and Systems (ICECS'2K), Kaslik, Lebanon, Dec. 2000, pp. 161-164.
    • (2000) Proc. 7th Int. Conf. Electronics, Circuits, and Systems (ICECS'2K) , pp. 161-164
    • Binkley, D.M.1    Bucher, M.2    Foty, D.P.3
  • 8
    • 0003332795 scopus 로고
    • Micropower techniques
    • J. Franca and Y. Tsividis, Eds. Englewood Cliffs, NJ: Prentice-Hall
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    • Y Tsividis and K. Suyama, "MOSFET modeling for analog circuit CAD: Problems and prospects," IEEE J. Solid-State Circuits, vol. 29, pp. 210-215, Mar. 1994.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.