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Volumn 44, Issue 6, 2000, Pages 887-894

Novel approach to charge-based non-quasi-static model of the MOS transistor valid in all modes of operation

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; SEMICONDUCTOR DEVICE MODELS;

EID: 0033727761     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(00)00040-X     Document Type: Article
Times cited : (50)

References (19)
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    • (1995) Analog Integ Circuits Signal Proc , vol.8 , pp. 83-114
    • Enz, C.1    Krummenacher, F.2    Vittoz, E.3
  • 2
    • 0003438251 scopus 로고    scopus 로고
    • Technical Report, Electronic Laboratories, Swiss Federal Institute of Technology EPFL, Lausanne, Switzerland, The complete description of the model can be found on the WEB at:
    • Bucher M, Lallement C, Enz C, Théodoloz F, Krummenacher F. The EPFL-EKV MOSFET model equations for simulation, model version 2.6. Technical Report, Electronic Laboratories, Swiss Federal Institute of Technology EPFL, Lausanne, Switzerland, 1997, The complete description of the model can be found on the WEB at: legwww.epfl.ch/ekv.
    • (1997) The EPFL-EKV MOSFET Model Equations for Simulation, Model Version 2.6
    • Bucher, M.1    Lallement, C.2    Enz, C.3    Théodoloz, F.4    Krummenacher, F.5
  • 4
    • 0022152815 scopus 로고
    • A small signal dc-to-high-frequency nonquasistatic model for the four-terminal MOSFET valid in all regions of operation
    • Bagheri M., Tsividis Y. A small signal dc-to-high-frequency nonquasistatic model for the four-terminal MOSFET valid in all regions of operation. IEEE Trans Electron Dev. ED-32(11):1985;2383-2391.
    • (1985) IEEE Trans Electron Dev , vol.32 , Issue.11 , pp. 2383-2391
    • Bagheri, M.1    Tsividis, Y.2
  • 5
    • 0023292182 scopus 로고
    • A non-quasi-static analysis of the transient behavior of the long-channel MOST valid in all regions of operation
    • Mancini P., Turchetti C., Masetti G. A non-quasi-static analysis of the transient behavior of the long-channel MOST valid in all regions of operation. IEEE Trans Electron Dev. ED-34(2):1987;325-334.
    • (1987) IEEE Trans Electron Dev , vol.34 , Issue.2 , pp. 325-334
    • Mancini, P.1    Turchetti, C.2    Masetti, G.3
  • 6
    • 0024703548 scopus 로고
    • Modeling of the MOS transistor for high frequency analog design
    • Vandeloo P.J.V., Sansen W.M.C. Modeling of the MOS transistor for high frequency analog design. IEEE Trans Comp-Aided Design. 8(7):1989;713-723.
    • (1989) IEEE Trans Comp-Aided Design , vol.8 , Issue.7 , pp. 713-723
    • Vandeloo, P.J.V.1    Sansen, W.M.C.2
  • 7
    • 0026156001 scopus 로고
    • A charge conserving non-quasi-static (NQS) MOSFET model for SPICE transient analysis
    • Park H.-.J., Ko P.K., Hu C. A charge conserving non-quasi-static (NQS) MOSFET model for SPICE transient analysis. IEEE Trans Comp-Aided Design. 10(5):1991;629-642.
    • (1991) IEEE Trans Comp-Aided Design , vol.10 , Issue.5 , pp. 629-642
    • Park, H.-j.1    Ko, P.K.2    Hu, C.3
  • 8
    • 0026928767 scopus 로고
    • A non-quasi-static MOSFET model for SPICE-AC analysis
    • Park H.-J., Ko P.K., Hu C. A non-quasi-static MOSFET model for SPICE-AC analysis. IEEE Trans Comp-Aided Design. 11(10):1992;1247-1257.
    • (1992) IEEE Trans Comp-Aided Design , vol.11 , Issue.10 , pp. 1247-1257
    • Park, H.-J.1    Ko, P.K.2    Hu, C.3
  • 10
    • 0029220835 scopus 로고
    • An analytical model for the non-quasi-static small-signal behavior of submicron MOSFETs
    • Smedes T., Klaassen F.M. An analytical model for the non-quasi-static small-signal behavior of submicron MOSFETs. Solid-State Electron. 38(1):1995;121-130.
    • (1995) Solid-State Electron , vol.38 , Issue.1 , pp. 121-130
    • Smedes, T.1    Klaassen, F.M.2
  • 17
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    • An explicit physical model for the long-channel MOS transistor including small-signal parameters
    • Cunha A.I.A., Schneider M.C., Galup-Montoro C. An explicit physical model for the long-channel MOS transistor including small-signal parameters. Solid-State Electron. 38(11):1995;1945-1952.
    • (1995) Solid-State Electron , vol.38 , Issue.11 , pp. 1945-1952
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  • 19
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    • An efficient parameter extraction methodology for the EKV MOST model
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    • (1996) Proc IEEE Int Conf Test Struct , vol.9 , pp. 145-150
    • Bucher, M.1    Lallement, C.2    Enz, C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.