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Volumn 25, Issue 2, 2004, Pages 107-109

A Continuous, Analytic Drain-Current Model for DG MOSFETs

Author keywords

Modeling; MOSFETs; Transistors

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; FERMI LEVEL; MATHEMATICAL MODELS; POISSON EQUATION; TRANSISTORS; VLSI CIRCUITS;

EID: 1342286939     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2003.822661     Document Type: Article
Times cited : (399)

References (6)
  • 1
    • 49949134400 scopus 로고
    • Effects of diffusion current on characteristics of metal-oxide (insulator) - Semiconductor transistors
    • H. C. Pao and C. T. Sah, "Effects of diffusion current on characteristics of metal-oxide (insulator) - semiconductor transistors," Solid-State Electron., vol. 9, p. 927, 1966.
    • (1966) Solid-state Electron. , vol.9 , pp. 927
    • Pao, H.C.1    Sah, C.T.2
  • 2
    • 0017932965 scopus 로고
    • A charge sheet model of the MOSFET
    • J. R. Brews, "A charge sheet model of the MOSFET," Solid-State Electron., vol. 21, p. 345, 1978.
    • (1978) Solid-state Electron. , vol.21 , pp. 345
    • Brews, J.R.1
  • 3
    • 33646900503 scopus 로고    scopus 로고
    • Device scaling limits of Si MOSFETs and their application dependencies
    • Mar.
    • D. J. Frank, R. H. Dennard, E. Nowak, P. M. Solomon, Y. Taur, and H.-S. Wong, "Device scaling limits of Si MOSFETs and their application dependencies," Proc. IEEE, vol. 89, pp. 259-288, Mar. 2001.
    • (2001) Proc. IEEE , vol.89 , pp. 259-288
    • Frank, D.J.1    Dennard, R.H.2    Nowak, E.3    Solomon, P.M.4    Taur, Y.5    Wong, H.-S.6
  • 4
    • 0033732282 scopus 로고    scopus 로고
    • An analytical solution to a double-gate MOSFET with undoped body
    • May
    • Y. Taur, "An analytical solution to a double-gate MOSFET with undoped body," IEEE Electron Device Lett., vol. 21, pp. 245-247, May 2000.
    • (2000) IEEE Electron Device Lett. , vol.21 , pp. 245-247
    • Taur, Y.1
  • 6
    • 0035694506 scopus 로고    scopus 로고
    • Analytic solutions of charge and capacitance in symmetric and asymmetric double-gate MOSFETs
    • Dec.
    • Y. Taur, "Analytic solutions of charge and capacitance in symmetric and asymmetric double-gate MOSFETs," IEEE Trans. Electron Devices, vol. 48, p. 2861, Dec. 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , pp. 2861
    • Taur, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.