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Volumn 50, Issue 15, 2002, Pages 3803-3816

The connection between ab initio calculations and interface adhesion measurements on metal/oxide systems: Ni/Al2O3 and Cu/Al2O3

(3) Zhang, W a Smith, J R b Evans, A G a

a Princeton University (United States)

b DELPHI CORPORATION (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; BRITTLENESS; CHEMICAL BONDS; COPPER ALLOYS; DIFFUSION; FRACTURE TESTING; INTERFACES (MATERIALS); OXYGEN; PARTIAL PRESSURE; PLASTICITY; SEPARATION; STOICHIOMETRY;

INTERFACE ADHESION MEASUREMENTS;

NICKEL ALLOYS;

EID: 0037015218 PISSN: 13596454 EISSN: None Source Type: Journal
DOI: 10.1016/S1359-6454(02)00177-5 Document Type: Article

Times cited : (231)

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