Diffuse X-ray scattering of InGaAs/GaAs quantum dots

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 21, Issue 2-4, 2004, Pages 684-688

  Hanke, M ^a   Grigoriev, D ^a   Schmidbauer, M ^a   Schafer P ^a   Kohler R ^a   Pohl, U W ^b   Sellin, R L ^b   Bimberg, D ^b   Zakharov, N D ^c   Werner, P ^c  

^a HUMBOLDT UNIVERSITY   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Diffuse X ray scattering; InGaAs GaAs quantum dots; MOCVD

Indexed keywords

COMPUTER SIMULATION; FINITE ELEMENT METHOD; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTOELECTRONIC DEVICES; SEMICONDUCTING INDIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

DIFFUSE X-RAY SCATTERING; DYNAMICAL SCATTERING;

SEMICONDUCTOR QUANTUM DOTS;

EID: 12144290214     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2003.11.107     Document Type: Conference Paper

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