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Volumn , Issue , 2003, Pages 149-154
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Low-cost, on-line software-based self-testing of embedded processor cores
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Author keywords
Automatic testing; Built in self test; Energy consumption; Fault detection; Hardware; Informatics; Manufacturing; Redundancy; Software testing; System testing
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Indexed keywords
AUTOMATIC TESTING;
COMPUTER HARDWARE;
COSTS;
ELECTRIC POWER UTILIZATION;
EMBEDDED SYSTEMS;
ENERGY UTILIZATION;
FAULT DETECTION;
HARDWARE;
INTEGRATED CIRCUIT TESTING;
LIFE CYCLE;
MANUFACTURE;
REDUNDANCY;
SOFTWARE TESTING;
DETECTION CAPABILITY;
EMBEDDED PROCESSORS;
INFORMATICS;
LOW-COST ON-LINE TEST;
LOW-POWER CONSUMPTION;
NORMAL OPERATIONS;
SOFTWARE-BASED SELF-TEST;
SYSTEM TESTING;
BUILT-IN SELF TEST;
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EID: 11844285816
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/OLT.2003.1214382 Document Type: Conference Paper |
Times cited : (7)
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References (11)
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