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Volumn , Issue , 2003, Pages 149-154

Low-cost, on-line software-based self-testing of embedded processor cores

Author keywords

Automatic testing; Built in self test; Energy consumption; Fault detection; Hardware; Informatics; Manufacturing; Redundancy; Software testing; System testing

Indexed keywords

AUTOMATIC TESTING; COMPUTER HARDWARE; COSTS; ELECTRIC POWER UTILIZATION; EMBEDDED SYSTEMS; ENERGY UTILIZATION; FAULT DETECTION; HARDWARE; INTEGRATED CIRCUIT TESTING; LIFE CYCLE; MANUFACTURE; REDUNDANCY; SOFTWARE TESTING;

EID: 11844285816     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/OLT.2003.1214382     Document Type: Conference Paper
Times cited : (7)

References (11)
  • 1
    • 0032306939 scopus 로고    scopus 로고
    • Native mode functional test generation for processors with applications to self-test and design validation
    • J.Shen, J.Abraham, "Native mode functional test generation for processors with applications to self-test and design validation", in Proc. of IEEE ITC 1998, pp. 990-999.
    • Proc. of IEEE ITC 1998 , pp. 990-999
    • Shen, J.1    Abraham, J.2
  • 7
    • 0036890982 scopus 로고    scopus 로고
    • Error Detection by Selective Procedure Call Duplication for Low Energy Consumption
    • December
    • N. Oh, E.J.McCluskey, "Error Detection by Selective Procedure Call Duplication for Low Energy Consumption", in IEEE Trans. on Reliability, Vol. 51, No. 4 December 2002 pp.392-402
    • (2002) IEEE Trans. on Reliability , vol.51 , Issue.4 , pp. 392-402
    • Oh, N.1    McCluskey, E.J.2
  • 10
    • 11844261646 scopus 로고    scopus 로고
    • Plasma CPU Model. http://www.opencores.org/projects/mips
    • Plasma CPU Model


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.