Internal electric field measurements in cadmium zinc telluride using transmission two-modulator generalized ellipsometry

Journal of Electronic Materials

Volumn 32, Issue 7, 2003, Pages 789-795

  Jellison Jr , G E ^a   Holcomb, D E ^a   Griffiths, C O ^b   Groza, M ^c   Burger, A ^c   Li, L ^d   Lu, F ^d  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Hinds Instruments Incorporated   (United States)

^c FISK UNIVERSITY   (United States)

^d Yinnel Tech Inc   (United States)

Author keywords

CdZnTe; Ellipsometry; Pockels coefficient

Indexed keywords

ELECTRIC FIELDS; ELECTRIC POTENTIAL; ELLIPSOMETRY; SCANNING;

POCKELS COEFFICIENT;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0041766138     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-003-0072-8     Document Type: Conference Paper

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