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Volumn 27, Issue 4, 2005, Pages 663-670

Effect of deposition temperature on the chemical properties of thermally deposited silicon nitride films

Author keywords

Chemical bonds; Chemical properties; Dielectric Films; DMDS; Ellipsometer and FTIR; Silicon nitride; Thermal CVD

Indexed keywords

AMMONIA; CHEMICAL VAPOR DEPOSITION; DEPOSITION; DIELECTRIC FILMS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROGEN BONDS; NITROGEN; SPECTROSCOPY; THERMAL EFFECTS; VLSI CIRCUITS;

EID: 11244353457     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2004.09.004     Document Type: Article
Times cited : (26)

References (44)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.