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Volumn 27, Issue 4, 2005, Pages 663-670
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Effect of deposition temperature on the chemical properties of thermally deposited silicon nitride films
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Author keywords
Chemical bonds; Chemical properties; Dielectric Films; DMDS; Ellipsometer and FTIR; Silicon nitride; Thermal CVD
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Indexed keywords
AMMONIA;
CHEMICAL VAPOR DEPOSITION;
DEPOSITION;
DIELECTRIC FILMS;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
HYDROGEN BONDS;
NITROGEN;
SPECTROSCOPY;
THERMAL EFFECTS;
VLSI CIRCUITS;
CHEMICAL PROPERTIES;
DIMETHYL DICHLORO SILANE (DMDS);
ELLIPSOMETER AND FTIR;
THERMAL-CVD;
SILICON NITRIDE;
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EID: 11244353457
PISSN: 09253467
EISSN: None
Source Type: Journal
DOI: 10.1016/j.optmat.2004.09.004 Document Type: Article |
Times cited : (26)
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References (44)
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