-
1
-
-
0009675023
-
-
(a) Bertrand, P.; Jonas, A.; Laschewsky, A.; Legras, R. Macromol. Rapid Commun. 2000, 21, 319.
-
(2000)
Macromol. Rapid Commun.
, vol.21
, pp. 319
-
-
Bertrand, P.1
Jonas, A.2
Laschewsky, A.3
Legras, R.4
-
2
-
-
0033894171
-
-
(b) Nyquist, R. M.; Eberhardt, A. S.; Silks, L. A., III; Li, Z.; Yang, X.; Swanson, B. I. Langmuir 2000, 16, 1793.
-
(2000)
Langmuir
, vol.16
, pp. 1793
-
-
Nyquist, R.M.1
Eberhardt, A.S.2
Silks L.A. III3
Li, Z.4
Yang, X.5
Swanson, B.I.6
-
3
-
-
0033639540
-
-
(c) Chen, Z.-H.; Yang, Y.-A.; Qiu, J.-B.; Yao, J.-N. Langmuir 2000, 16, 722.
-
(2000)
Langmuir
, vol.16
, pp. 722
-
-
Chen, Z.-H.1
Yang, Y.-A.2
Qiu, J.-B.3
Yao, J.-N.4
-
5
-
-
9644286534
-
-
(e) Moriguchi, I.; Teraoka, Y.; Kagawa, S.; Fendler, J. H. Chem. Mater. 1999, 11, 1603.
-
(1999)
Chem. Mater.
, vol.11
, pp. 1603
-
-
Moriguchi, I.1
Teraoka, Y.2
Kagawa, S.3
Fendler, J.H.4
-
6
-
-
0032024469
-
-
(f) Yang, X.; Shi, J.; Johnson, S.; Swanson, B. Langmuir 1998, 14, 1505.
-
(1998)
Langmuir
, vol.14
, pp. 1505
-
-
Yang, X.1
Shi, J.2
Johnson, S.3
Swanson, B.4
-
8
-
-
0030848621
-
-
(h) Decher, G. Science 1997, 277, 1232.
-
(1997)
Science
, vol.277
, pp. 1232
-
-
Decher, G.1
-
9
-
-
0030869767
-
-
(i) Schmitt, J.; Decher, G.; Dressick, W.J.; Brandow, S.L.; Geer, R.E.; Shashidhar, R.; Calvert, J. M. Adv. Mater. 1997, 9, 61.
-
(1997)
Adv. Mater.
, vol.9
, pp. 61
-
-
Schmitt, J.1
Decher, G.2
Dressick, W.J.3
Brandow, S.L.4
Geer, R.E.5
Shashidhar, R.6
Calvert, J.M.7
-
10
-
-
0033553114
-
-
(a) Kaschak, D. M.; Lean, J. T.; Waraksa, C. C.; Saupe, G. B.; Usami, H.; Mallouk, T. E. J. Am. Chem. Soc. 1999, 121, 3435.
-
(1999)
J. Am. Chem. Soc.
, vol.121
, pp. 3435
-
-
Kaschak, D.M.1
Lean, J.T.2
Waraksa, C.C.3
Saupe, G.B.4
Usami, H.5
Mallouk, T.E.6
-
11
-
-
21844471241
-
-
(b) Ollivier, P. J.; Kovtyukhova, N. I.; Keller, S. W.; Mallouk, T. E. J. Chem. Soc, Chem. Commun. 1998, 1563.
-
(1998)
J. Chem. Soc, Chem. Commun.
, pp. 1563
-
-
Ollivier, P.J.1
Kovtyukhova, N.I.2
Keller, S.W.3
Mallouk, T.E.4
-
12
-
-
0031576690
-
-
(c) Fang, M.; Kaschak, D. M.; Sutorik, A. C.; Mallouk, T. E. J. Am. Chem. Soc. 1997, 119, 12184.
-
(1997)
J. Am. Chem. Soc.
, vol.119
, pp. 12184
-
-
Fang, M.1
Kaschak, D.M.2
Sutorik, A.C.3
Mallouk, T.E.4
-
13
-
-
0001196710
-
-
Alberti, G., Bein, T., Eds.; Elsevier Science: Oxford, Chapter 6
-
(d) Mallouk, T. E.; Kim, H.-N.; Ollivier, P. J.; Keller, S. W. In Comprehensive Supramolecular Chemistry; Alberti, G., Bein, T., Eds.; Elsevier Science: Oxford, 1996; Chapter 6.
-
(1996)
Comprehensive Supramolecular Chemistry
-
-
Mallouk, T.E.1
Kim, H.-N.2
Ollivier, P.J.3
Keller, S.W.4
-
14
-
-
0000939174
-
-
(e) Keller, S. W.; Kim, H.-N.; Mallouk, T. E. J. Am. Chem. Soc. 1994, 116, 8817.
-
(1994)
J. Am. Chem. Soc.
, vol.116
, pp. 8817
-
-
Keller, S.W.1
Kim, H.-N.2
Mallouk, T.E.3
-
15
-
-
84986841299
-
-
(a) Decher, G.; Hong, J.-D. Makromol. Chem., Macromol. Symp. 1991, 46, 321.
-
(1991)
Makromol. Chem., Macromol. Symp.
, vol.46
, pp. 321
-
-
Decher, G.1
Hong, J.-D.2
-
16
-
-
44049115952
-
-
(b) Decher, G.; Hong, J.-D.; Schmitt, J. Thin Solid Films 1992, 210/211, 504.
-
(1992)
Thin Solid Films
, vol.210-211
, pp. 504
-
-
Decher, G.1
Hong, J.-D.2
Schmitt, J.3
-
18
-
-
0033898035
-
-
(a) Cassagneau, T.; Fendler, J. H.; Mallouk, T. E. Langmuir 2000, 16, 241.
-
(2000)
Langmuir
, vol.16
, pp. 241
-
-
Cassagneau, T.1
Fendler, J.H.2
Mallouk, T.E.3
-
19
-
-
0032511370
-
-
(b) Cassagneau, T.; Mallouk, T. E.; Fendler, J. H. J. Am. Chem. Soc. 1998, 120, 7848.
-
(1998)
J. Am. Chem. Soc.
, vol.120
, pp. 7848
-
-
Cassagneau, T.1
Mallouk, T.E.2
Fendler, J.H.3
-
21
-
-
0000108739
-
-
(b) Sun, J.; Sun, Y.; Zou, S.; Zhang, X.; Sun, C.; Wang, Y.; Shen, J. Macromol. Chem. Phys. 1999, 200, 840.
-
(1999)
Macromol. Chem. Phys.
, vol.200
, pp. 840
-
-
Sun, J.1
Sun, Y.2
Zou, S.3
Zhang, X.4
Sun, C.5
Wang, Y.6
Shen, J.7
-
23
-
-
0000070969
-
-
(d) Caruso, F.; Schüler, C.; Kurth, D. G. Chem. Mater. 1999, 11, 3394.
-
(1999)
Chem. Mater.
, vol.11
, pp. 3394
-
-
Caruso, F.1
Schüler, C.2
Kurth, D.G.3
-
24
-
-
0033606270
-
-
(e) Wu, A.; Yoo, D.; Lee, J.-K.; Rubner, M. F. J. Am. Chem. Soc. 1999, 121, 4883.
-
(1999)
J. Am. Chem. Soc.
, vol.121
, pp. 4883
-
-
Wu, A.1
Yoo, D.2
Lee, J.-K.3
Rubner, M.F.4
-
25
-
-
0032476819
-
-
(f) Schütte, M.; Kurth, D. G.; Linford, M. R.; Cölfen, H.; Mohwald, H. Angew. Chem., Int. Ed. Engl. 1998, 37, 2891.
-
(1998)
Angew. Chem., Int. Ed. Engl.
, vol.37
, pp. 2891
-
-
Schütte, M.1
Kurth, D.G.2
Linford, M.R.3
Cölfen, H.4
Mohwald, H.5
-
26
-
-
0031212849
-
-
(a) Cochin, D.; Passmann, M.; Wilbert, G.; Zentel, R.; Wischerhoff, E.; Laschewsky, A. Macromolecules 1997, 30, 4775.
-
(1997)
Macromolecules
, vol.30
, pp. 4775
-
-
Cochin, D.1
Passmann, M.2
Wilbert, G.3
Zentel, R.4
Wischerhoff, E.5
Laschewsky, A.6
-
27
-
-
6244276911
-
-
(b) Hodak J.; Etchenique, R.; Calvo, E. J.; Singhal, K.; Bartlett, P. N. Langmuir 1997, 13, 2708.
-
(1997)
Langmuir
, vol.13
, pp. 2708
-
-
Hodak, J.1
Etchenique, R.2
Calvo, E.J.3
Singhal, K.4
Bartlett, P.N.5
-
28
-
-
0030817418
-
-
(c) Hou, S.-F.; Fang, H.-Q.; Chen, H.-Y. Anal. Lett. 1997, 30, 1631.
-
(1997)
Anal. Lett.
, vol.30
, pp. 1631
-
-
Hou, S.-F.1
Fang, H.-Q.2
Chen, H.-Y.3
-
29
-
-
77249085463
-
-
(a) Foucher, D. A.; Tang, B.-Z.; Manners, I. J. Am. Chem. Soc. 1992, 114, 6246.
-
(1992)
J. Am. Chem. Soc.
, vol.114
, pp. 6246
-
-
Foucher, D.A.1
Tang, B.-Z.2
Manners, I.3
-
32
-
-
0031695722
-
-
(a) MacLachlan, M. J.; Aroca, P.; Coombs, N.; Manners, I; Ozin, G. A. Adv. Mater. 1998, 10, 144.
-
(1998)
Adv. Mater.
, vol.10
, pp. 144
-
-
MacLachlan, M.J.1
Aroca, P.2
Coombs, N.3
Manners, I.4
Ozin, G.A.5
-
33
-
-
0032312995
-
-
(b) Massey, J. A.; Power, K. N.; Winnik, M. A.; Manners, I. Adv. Mater. 1998, 10, 1559.
-
(1998)
Adv. Mater.
, vol.10
, pp. 1559
-
-
Massey, J.A.1
Power, K.N.2
Winnik, M.A.3
Manners, I.4
-
34
-
-
0034716732
-
-
(c) MacLachlan, M. J.; Ginzburg, M.; Coombs, N.; Raju, N. P.; Greedan, J. E.; Ozin, G. A.; Manners, I. J. Am. Chem. Soc. 2000, 122, 3878.
-
(2000)
J. Am. Chem. Soc.
, vol.122
, pp. 3878
-
-
MacLachlan, M.J.1
Ginzburg, M.2
Coombs, N.3
Raju, N.P.4
Greedan, J.E.5
Ozin, G.A.6
Manners, I.7
-
35
-
-
0034712087
-
-
(d) MacLachlan, M. J.; Ginzburg, M.; Coombs, N.; Coyle, T. W.; Raju, N. P.; Greedan, J. E.; Ozin, G. A.; Manners, I. Science 2000, 287, 1460.
-
(2000)
Science
, vol.287
, pp. 1460
-
-
MacLachlan, M.J.1
Ginzburg, M.2
Coombs, N.3
Coyle, T.W.4
Raju, N.P.5
Greedan, J.E.6
Ozin, G.A.7
Manners, I.8
-
37
-
-
0034227370
-
-
(b) Jäkle, F.; Vejzovic, E.; Power-Billard, K. N.; MacLachlan, M. J.; Lough, A. J.; Manners, I. Organometallics 2000, 19, 2826.
-
(2000)
Organometallics
, vol.19
, pp. 2826
-
-
Jäkle, F.1
Vejzovic, E.2
Power-Billard, K.N.3
MacLachlan, M.J.4
Lough, A.J.5
Manners, I.6
-
38
-
-
85021707784
-
-
in press (see Supplementary Information for relevant experimental details)
-
(c) Jakle, F.; Wang, Z.; Manners, I. Macromol. Rapid Commun., in press (see Supplementary Information for relevant experimental details).
-
Macromol. Rapid Commun.
-
-
Jakle, F.1
Wang, Z.2
Manners, I.3
-
39
-
-
0343352876
-
-
U.S. Patent 308856, 1994
-
The refractive index used for PFS in the determination of ellipsometric thickness was that reported for a similar poly(ferrocene). See: Pannell, K. H.; Robillard, J. U.S. Patent 308856, 1994.
-
-
-
Pannell, K.H.1
Robillard, J.2
-
42
-
-
14844342761
-
-
(b) Rotenberg, Y.; Boruvka, L.; Neumann, A. W. J. Colloid. Interface Sci. 1983, 93, 169.
-
(1983)
J. Colloid. Interface Sci.
, vol.93
, pp. 169
-
-
Rotenberg, Y.1
Boruvka, L.2
Neumann, A.W.3
-
43
-
-
0030590347
-
-
(c) Kwok, D. Y.; Lin, R.; Mui, M.; Neumann, A. W. Colloid Surf. A 1996, 116, 63.
-
(1996)
Colloid Surf. A
, vol.116
, pp. 63
-
-
Kwok, D.Y.1
Lin, R.2
Mui, M.3
Neumann, A.W.4
-
45
-
-
11544371002
-
-
(b) Arys, X.; Jonas, A. M.; Laguitton, B.; Laschewsky, A.; Legras, R.; Wischerhoff, E. Thin Solid Films 1998, 327-329, 734.
-
(1998)
Thin Solid Films
, vol.327-329
, pp. 734
-
-
Arys, X.1
Jonas, A.M.2
Laguitton, B.3
Laschewsky, A.4
Legras, R.5
Wischerhoff, E.6
-
46
-
-
0031556479
-
-
(c) Raposo, M.; Pontes, R. S.; Mattoso, L. H. C.; Oliveira, O. N., Jr. Macromolecules 1997, 30, 6095.
-
(1997)
Macromolecules
, vol.30
, pp. 6095
-
-
Raposo, M.1
Pontes, R.S.2
Mattoso, L.H.C.3
Oliveira O.N., Jr.4
-
47
-
-
0031352337
-
-
(d) Hsieh, M. C.; Farms, R. J.; McCarthy, T. J. Macromolecules 1997, 30, 8453.
-
(1997)
Macromolecules
, vol.30
, pp. 8453
-
-
Hsieh, M.C.1
Farms, R.J.2
McCarthy, T.J.3
-
48
-
-
0002795734
-
-
(e) Schlenoff, J. B.; Laurent, D.; Ly, H.; Stepp, J. Adv. Mater. 1998, 10, 347.
-
(1998)
Adv. Mater.
, vol.10
, pp. 347
-
-
Schlenoff, J.B.1
Laurent, D.2
Ly, H.3
Stepp, J.4
-
49
-
-
0030197303
-
-
Others have observed that the incremental thickness change is independent of the chemical nature of the support. See for example: (a) Hoogeveen, N. G.; Cohen, S. M. A.; Fleer, G. J.; Böhmer, M. R. Langmuir 1996, 12, 3675.
-
(1996)
Langmuir
, vol.12
, pp. 3675
-
-
Hoogeveen, N.G.1
Cohen, S.M.A.2
Fleer, G.J.3
Böhmer, M.R.4
-
50
-
-
0031357888
-
-
(b) Laschewsky, A.; Wischerhoff, E.; Kauranen, M.; Persoons, A. Macromolecules 1997, 30, 8304.
-
(1997)
Macromolecules
, vol.30
, pp. 8304
-
-
Laschewsky, A.1
Wischerhoff, E.2
Kauranen, M.3
Persoons, A.4
-
52
-
-
0343352871
-
-
note
-
It is plausible that the nonlinearity of the measured absorbance changes at 450 nm in the early layers may be attributed to the larger error associated with obtaining the maximum peak value of the weak and broad d-d absorption.
-
-
-
-
53
-
-
0003459529
-
-
Chastain, J., Ed.; Perkin-Elmer Corporation: London
-
Moulder, J. F.; Stickle, W. F.; Sobol, P. E.; Bomben, K. D. In Handbook of X-ray Photoelectron Spectroscopy: a reference book of standard spectra for identification and interpretation of XPS data; Chastain, J., Ed.; Perkin-Elmer Corporation: London, 1992.
-
(1992)
Handbook of X-ray Photoelectron Spectroscopy: A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data
-
-
Moulder, J.F.1
Stickle, W.F.2
Sobol, P.E.3
Bomben, K.D.4
-
54
-
-
0024278638
-
-
Lee, H.; Kepiey, L. J.; Hong, H.-G.; Akhter, S.; Mallouk, T. E. J. Phys. Chem. 1988, 92, 2597.
-
(1988)
J. Phys. Chem.
, vol.92
, pp. 2597
-
-
Lee, H.1
Kepiey, L.J.2
Hong, H.-G.3
Akhter, S.4
Mallouk, T.E.5
-
55
-
-
0343352870
-
-
note
-
1/2 peaks appearing at 708 and 720 eV, respectively, are easily identified, while the sulfur 1s peak at 232 eV is less distinguishable due to its lower XPS sensitivity.
-
-
-
-
56
-
-
0032095225
-
-
(a) Yoo, D.; Shiratori, S.S.; Rubner, M. F. Macromolecules 1998, 31, 4309.
-
(1998)
Macromolecules
, vol.31
, pp. 4309
-
-
Yoo, D.1
Shiratori, S.S.2
Rubner, M.F.3
-
58
-
-
13444258765
-
-
Smoothing of a surface with layer-by-layer deposition of multilayer films is consistent with previously characterized systems. See for example: (a) Lvov, Y.; Decher, G.; Mohwald, H. Langmuir 1993, 9, 481.
-
(1993)
Langmuir
, vol.9
, pp. 481
-
-
Lvov, Y.1
Decher, G.2
Mohwald, H.3
-
59
-
-
0000594014
-
-
(b) Kerimo, J.; Adams, D. M.; Barbara, P. F.; Kaschak, D. M.; Mallouk, T. E. J. Phys. Chem. B 1998, 102, 9451.
-
(1998)
J. Phys. Chem. B
, vol.102
, pp. 9451
-
-
Kerimo, J.1
Adams, D.M.2
Barbara, P.F.3
Kaschak, D.M.4
Mallouk, T.E.5
-
60
-
-
0000539071
-
-
(c) Yang, H. C.; Aoki, K.; Hong, H.-G.; Sackett, D. D.; Arendt, M. F.; Yau, S.-L.; Bell, C. M.; Mallouk, T. E. J. Am. Chem. Soc. 1993, 115, 11855.
-
(1993)
J. Am. Chem. Soc.
, vol.115
, pp. 11855
-
-
Yang, H.C.1
Aoki, K.2
Hong, H.-G.3
Sackett, D.D.4
Arendt, M.F.5
Yau, S.-L.6
Bell, C.M.7
Mallouk, T.E.8
|