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Volumn 16, Issue 24, 2000, Pages 9609-9614

Layer-by-layer self-assembly of organic-organometallic polymer electrostatic superlattices using poly(ferrocenylsilanes)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; ELLIPSOMETRY; GOLD; METALLORGANIC POLYMERS; POLYSTYRENES; QUARTZ; REDOX REACTIONS; SILANES; SILICON; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 11244300842     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0012283     Document Type: Article
Times cited : (79)

References (60)
  • 8
    • 0030848621 scopus 로고    scopus 로고
    • (h) Decher, G. Science 1997, 277, 1232.
    • (1997) Science , vol.277 , pp. 1232
    • Decher, G.1
  • 38
    • 85021707784 scopus 로고    scopus 로고
    • in press (see Supplementary Information for relevant experimental details)
    • (c) Jakle, F.; Wang, Z.; Manners, I. Macromol. Rapid Commun., in press (see Supplementary Information for relevant experimental details).
    • Macromol. Rapid Commun.
    • Jakle, F.1    Wang, Z.2    Manners, I.3
  • 39
    • 0343352876 scopus 로고    scopus 로고
    • U.S. Patent 308856, 1994
    • The refractive index used for PFS in the determination of ellipsometric thickness was that reported for a similar poly(ferrocene). See: Pannell, K. H.; Robillard, J. U.S. Patent 308856, 1994.
    • Pannell, K.H.1    Robillard, J.2
  • 49
    • 0030197303 scopus 로고    scopus 로고
    • Others have observed that the incremental thickness change is independent of the chemical nature of the support. See for example: (a) Hoogeveen, N. G.; Cohen, S. M. A.; Fleer, G. J.; Böhmer, M. R. Langmuir 1996, 12, 3675.
    • (1996) Langmuir , vol.12 , pp. 3675
    • Hoogeveen, N.G.1    Cohen, S.M.A.2    Fleer, G.J.3    Böhmer, M.R.4
  • 52
    • 0343352871 scopus 로고    scopus 로고
    • note
    • It is plausible that the nonlinearity of the measured absorbance changes at 450 nm in the early layers may be attributed to the larger error associated with obtaining the maximum peak value of the weak and broad d-d absorption.
  • 55
    • 0343352870 scopus 로고    scopus 로고
    • note
    • 1/2 peaks appearing at 708 and 720 eV, respectively, are easily identified, while the sulfur 1s peak at 232 eV is less distinguishable due to its lower XPS sensitivity.
  • 58
    • 13444258765 scopus 로고
    • Smoothing of a surface with layer-by-layer deposition of multilayer films is consistent with previously characterized systems. See for example: (a) Lvov, Y.; Decher, G.; Mohwald, H. Langmuir 1993, 9, 481.
    • (1993) Langmuir , vol.9 , pp. 481
    • Lvov, Y.1    Decher, G.2    Mohwald, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.