Metal nanoparticle/polymer superlattice films: Fabrication and control of layer structure

Advanced Materials

Volumn 9, Issue 1, 1997, Pages 61-65

  Schmitt, Johannes ^a,b   Decker, Gero ^a   Dressick, Walter J ^c   Brandow, Susan L ^c   Geer, Robert E ^c   Shashidhar, R ^c   Calvert, Jeffrey M ^c  

^a UNIVERSITÉ DE STRASBOURG   (France)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

^c NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; FABRICATION; GOLD; METALLIC SUPERLATTICES; MONOLAYERS; MULTILAYERS; NANOSTRUCTURED MATERIALS; POLYELECTROLYTES; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SPECTROSCOPY;

BRAGG SCATTERING; NANOPARTICLE; OPTICAL SPECTROSCOPY; POLYETHYLENEIMINE; POLYSTYRENE SULFURATE SODIUM SALT; X RAY REFLECTIVITY; X RAY SCATTERING;

METALLIC FILMS;

EID: 0030869767     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.19970090114     Document Type: Article

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