-
1
-
-
0030126134
-
A review of the techniques used for modeling single-event effects in power mosfets
-
Apr.
-
G. H. Johnson, J.-M. Palau, C. Dachs, K. F. Galloway, and R. D. Schrimpf, "A review of the techniques used for modeling single-event effects in power mosfets," IEEE Trans. Nucl. Sci., vol. 43, pp. 546-560, Apr. 1996.
-
(1996)
IEEE Trans. Nucl. Sci.
, vol.43
, pp. 546-560
-
-
Johnson, G.H.1
Palau, J.-M.2
Dachs, C.3
Galloway, K.F.4
Schrimpf, R.D.5
-
2
-
-
0030674986
-
Irradiation experiments with high voltage power devices as a possible means to predict failure rates due to cosmic rays
-
Weimar, Germany
-
P. Voss, K. H. Maier, H. Becker, E. Normand, J. Wert, K. Oberg, and P. Majewske, "Irradiation experiments with high voltage power devices as a possible means to predict failure rates due to cosmic rays," in Proc. IEEE Int. Symp. Power Semiconductor Devices and ICs, Weimar, Germany, 1997, pp. 169-173.
-
(1997)
Proc. IEEE Int. Symp. Power Semiconductor Devices and ICs
, pp. 169-173
-
-
Voss, P.1
Maier, K.H.2
Becker, H.3
Normand, E.4
Wert, J.5
Oberg, K.6
Majewske, P.7
-
3
-
-
0001486737
-
Displacement of atoms during irradiation
-
New York: Academic
-
F. Seitz and J. S. Koehler, "Displacement of atoms during irradiation," in Solid State Physics. New York: Academic, 1956, vol. 2.
-
(1956)
Solid State Physics
, vol.2
-
-
Seitz, F.1
Koehler, J.S.2
-
4
-
-
0001457492
-
Nuclear dynamics, experimental
-
July
-
M. S. Livingston and H. A. Bethe, "Nuclear dynamics, experimental," Rev. Modern Phys., vol. 9, pp. 245-390, July 1937.
-
(1937)
Rev. Modern Phys.
, vol.9
, pp. 245-390
-
-
Livingston, M.S.1
Bethe, H.A.2
-
5
-
-
36149017115
-
Energy dependence of proton damage in silicon
-
G. W. Simon, J. M. Denny, and R. G. Downing, "Energy dependence of proton damage in silicon," Phys. Rev., vol. 129, pp. 2454-2459, 1963.
-
(1963)
Phys. Rev.
, vol.129
, pp. 2454-2459
-
-
Simon, G.W.1
Denny, J.M.2
Downing, R.G.3
-
6
-
-
1242310311
-
NIEL for heavy ions: An analytic approach
-
Dec.
-
S. R. Messenger, E. A. Burke, M. A. Xapsos, G. P. Summers, R. J. Walters, I. Jun, and T. Jordan, "NIEL for heavy ions: an analytic approach," IEEE Trans. Nucl. Sci., vol. 50, pp. 1919-1923, Dec. 2003.
-
(2003)
IEEE Trans. Nucl. Sci.
, vol.50
, pp. 1919-1923
-
-
Messenger, S.R.1
Burke, E.A.2
Xapsos, M.A.3
Summers, G.P.4
Walters, R.J.5
Jun, I.6
Jordan, T.7
-
7
-
-
0027844647
-
Damage correlations in semiconductors exposed to gamma, electron and proton radiation
-
Dec.
-
G. P. Summers, E. A. Burke, P. Shapiro, S. R. Messenger, and R. J. Walters, "Damage correlations in semiconductors exposed to gamma, electron and proton radiation," IEEE Trans. Nucl. Sci., vol. 40, pp. 1372-1379, Dec. 1993.
-
(1993)
IEEE Trans. Nucl. Sci.
, vol.40
, pp. 1372-1379
-
-
Summers, G.P.1
Burke, E.A.2
Shapiro, P.3
Messenger, S.R.4
Walters, R.J.5
-
8
-
-
0002861764
-
Problems related to p-n junctions in silicon
-
Jan.
-
W. Shockley, "Problems related to p-n junctions in silicon," Solid-State Electron., vol. 2, pp. 35-60, Jan. 1961.
-
(1961)
Solid-state Electron.
, vol.2
, pp. 35-60
-
-
Shockley, W.1
-
9
-
-
0038382314
-
Review of displacement damage effects in silicon devices
-
June
-
J. R. Srour, C. J. Marshall, and P. W. Marshall, "Review of displacement damage effects in silicon devices," IEEE Trans. Nucl. Sci., vol. 50, pp. 653-670, June 2003.
-
(2003)
IEEE Trans. Nucl. Sci.
, vol.50
, pp. 653-670
-
-
Srour, J.R.1
Marshall, C.J.2
Marshall, P.W.3
-
10
-
-
0037809217
-
Observation of local heating in an ion track by measuring the ion-induced luminescence spectrum
-
M. Koshimizu, K. Shibuya, K. Asai, and H. Shibata, "Observation of local heating in an ion track by measuring the ion-induced luminescence spectrum," Nucl. Instrum. Methods Phys. Res. B, vol. 206, pp. 57-60, 2003.
-
(2003)
Nucl. Instrum. Methods Phys. Res. B
, vol.206
, pp. 57-60
-
-
Koshimizu, M.1
Shibuya, K.2
Asai, K.3
Shibata, H.4
-
11
-
-
0036798603
-
Effects of damage build-up in range profiles in crystalline Si; molecular dynamics simulations
-
J. Peltola, K. Nordlund, and J. Keinonen, "Effects of damage build-up in range profiles in crystalline Si; molecular dynamics simulations," Nucl. Instrum. Methods Phys. Res. B, vol. 195, pp. 269-280, 2002.
-
(2002)
Nucl. Instrum. Methods Phys. Res. B
, vol.195
, pp. 269-280
-
-
Peltola, J.1
Nordlund, K.2
Keinonen, J.3
-
12
-
-
0001662330
-
Electronic power transfer in pulsed laser excitation of polar semiconductors
-
Dec.
-
W. Pötz and P. Kocevar, "Electronic power transfer in pulsed laser excitation of polar semiconductors," Phys. Rev. B, vol. 28, pp. 7040-7046, Dec. 1983.
-
(1983)
Phys. Rev. B
, vol.28
, pp. 7040-7046
-
-
Pötz, W.1
Kocevar, P.2
-
13
-
-
0042945924
-
Generation of nonequilibrium optical phonons in gaas and their application in studying intervalley electron-phonon scattering
-
C. L. Collins and P. Y. Yu, "Generation of nonequilibrium optical phonons in gaas and their application in studying intervalley electron-phonon scattering," Phys. Rev. B, vol. 30, pp. 4501-4515, 1984.
-
(1984)
Phys. Rev. B
, vol.30
, pp. 4501-4515
-
-
Collins, C.L.1
Yu, P.Y.2
-
14
-
-
84944378006
-
Measurement and modeling of self-heating in soi nmosfets
-
Jan.
-
L. T. Su, J. E. Chung, D. A. Antoniadis, K. E. Goodson, and M. I. Flik, "Measurement and modeling of self-heating in soi nmosfets," IEEE Trans. Electron Devices, vol. 41, pp. 69-75, Jan. 1994.
-
(1994)
IEEE Trans. Electron Devices
, vol.41
, pp. 69-75
-
-
Su, L.T.1
Chung, J.E.2
Antoniadis, D.A.3
Goodson, K.E.4
Flik, M.I.5
-
15
-
-
0000137070
-
Microscale energy transport in solids
-
New York: Taylor & Francis
-
C.-L. Tien, A. Majumdar, and F. M. Gerner, Eds., "Microscale Energy Transport in Solids," in Microscale Energy Transport. New York: Taylor & Francis, 1998, pp. 3-94.
-
(1998)
Microscale Energy Transport
, pp. 3-94
-
-
Tien, C.-L.1
Majumdar, A.2
Gerner, F.M.3
-
16
-
-
11144237551
-
Thermal characterization of single event burnout failure in semiconductor power devices
-
Mar.
-
D. G. Walker, T. S. Fisher, J. Liu, and R. D. Schrimpf, "Thermal characterization of single event burnout failure in semiconductor power devices," in Proc. Semi-Therm Conf., Mar. 2000.
-
(2000)
Proc. Semi-therm Conf.
-
-
Walker, D.G.1
Fisher, T.S.2
Liu, J.3
Schrimpf, R.D.4
-
17
-
-
0032477033
-
Single-event burnout in high power diodes
-
K. H. Maier, A. Denker, P. Voss, and H.-W. Becker, "Single-event burnout in high power diodes," Nucl. Instrum. Methods Phys. Res. B, vol. 146, pp. 596-600, 1998.
-
(1998)
Nucl. Instrum. Methods Phys. Res. B
, vol.146
, pp. 596-600
-
-
Maier, K.H.1
Denker, A.2
Voss, P.3
Becker, H.-W.4
-
18
-
-
0029504304
-
Cosmic ray induced failures in high power semiconductor devices
-
Dec.
-
H. R. Zeller, "Cosmic ray induced failures in high power semiconductor devices," Solid-State Electron., vol. 38, pp. 2041-2046, Dec. 1995.
-
(1995)
Solid-state Electron.
, vol.38
, pp. 2041-2046
-
-
Zeller, H.R.1
-
19
-
-
0028697097
-
Cosmic radiation as a possble cause for power device failure and possible countermeasures
-
Davos, Switzerland, May
-
H. Kabza, H.-J. Schulze, Y. Gerstenmaier, P. Voss, J. Wilhelmi, W. Schmid, F. Pfirsch, and K. Platzöder, "Cosmic radiation as a possble cause for power device failure and possible countermeasures," in Proc. 6th Int. Symp. Power Semiconductor Devices & ICs, Davos, Switzerland, May 1994, pp. 9-12.
-
(1994)
Proc. 6th Int. Symp. Power Semiconductor Devices & ICs
, pp. 9-12
-
-
Kabza, H.1
Schulze, H.-J.2
Gerstenmaier, Y.3
Voss, P.4
Wilhelmi, J.5
Schmid, W.6
Pfirsch, F.7
Platzöder, K.8
-
20
-
-
78249271059
-
Simulation of single-event failure in power diodes
-
Nov.
-
D. Walker, A. Al-badri, R. Schrimpf, and T. Fisher, "Simulation of single-event failure in power diodes," in Proc. Int. Mechanical Engineering Congress and Expo, Nov. 2002.
-
(2002)
Proc. Int. Mechanical Engineering Congress and Expo
-
-
Walker, D.1
Al-Badri, A.2
Schrimpf, R.3
Fisher, T.4
-
21
-
-
0038647110
-
Coupled phonon energy transport in semiconductor devices
-
Orlando, FL, Nov.
-
D. G. Walker, T. S. Fisher, J. Ralston-Good, and R. D. Schrimpf, "Coupled phonon energy transport in semiconductor devices," in Proc. ASME Int. Mechanical Engineering Congress and Exhibit, vol. 2, Orlando, FL, Nov. 2000, pp. 325-330.
-
(2000)
Proc. ASME Int. Mechanical Engineering Congress and Exhibit
, vol.2
, pp. 325-330
-
-
Walker, D.G.1
Fisher, T.S.2
Ralston-Good, J.3
Schrimpf, R.D.4
-
22
-
-
0037936539
-
Simulation of nonequilibrium thermal effects in power LDMOS transistors
-
Aug.
-
A. Raman, D. G. Walker, and T. S. Fisher, "Simulation of nonequilibrium thermal effects in power LDMOS transistors," Solid-State Electron., vol. 47, pp. 1265-1273, Aug. 2003.
-
(2003)
Solid-state Electron.
, vol.47
, pp. 1265-1273
-
-
Raman, A.1
Walker, D.G.2
Fisher, T.S.3
-
23
-
-
0035422243
-
Monte carlo study of phonon transport in solid thin films including dispersion and polarization
-
S. Mazumdar and A. Majumdar, "Monte carlo study of phonon transport in solid thin films including dispersion and polarization," J. Heat Transfer, vol. 123, pp. 749-759, 2001.
-
(2001)
J. Heat Transfer
, vol.123
, pp. 749-759
-
-
Mazumdar, S.1
Majumdar, A.2
-
27
-
-
36149027857
-
Analysis of lattice thermal conductivity
-
Dec.
-
M. G. Holland, "Analysis of lattice thermal conductivity," Phys. Rev., vol. 132, pp. 2461-2471, Dec. 1963.
-
(1963)
Phys. Rev.
, vol.132
, pp. 2461-2471
-
-
Holland, M.G.1
-
30
-
-
0017453673
-
A review of some charge transport properties
-
Feb.
-
C. Jacoboni, C. Cananli, G. Ottaviani, and A. A. Quaranta, "A review of some charge transport properties," Solid State Electron., vol. 20, pp. 77-89, Feb. 1977.
-
(1977)
Solid State Electron.
, vol.20
, pp. 77-89
-
-
Jacoboni, C.1
Cananli, C.2
Ottaviani, G.3
Quaranta, A.A.4
-
31
-
-
33749406556
-
Role of thermal spikes in energetic displacement cascades
-
Oct.
-
T. D. de la Rubia, R. S. Averback, R. Benedek, and W. E. King, "Role of thermal spikes in energetic displacement cascades," Phys. Rev. Lett., vol. 59, pp. 1930-1933, Oct. 1987.
-
(1987)
Phys. Rev. Lett.
, vol.59
, pp. 1930-1933
-
-
De La Rubia, T.D.1
Averback, R.S.2
Benedek, R.3
King, W.E.4
-
32
-
-
0037881676
-
Irradiation-induced defect production in elemental metals and semiconductors: A review of recent molecular dynamics studies
-
T. D. de la Rubia, "Irradiation-induced defect production in elemental metals and semiconductors: a review of recent molecular dynamics studies," Annu. Rev. Mater. Sci., vol. 26, pp. 613-649, 1996.
-
(1996)
Annu. Rev. Mater. Sci.
, vol.26
, pp. 613-649
-
-
De La Rubia, T.D.1
-
33
-
-
0036952854
-
Correlating TEM images of damage in irradiated materials to molecular dynamics simulations
-
R. Schaeublin, M.-J. Catula, M. Wall, T. Felter, M. Fluss, B. D. Wirth, T. D. de la Rubia, and M. Victoria, "Correlating TEM images of damage in irradiated materials to molecular dynamics simulations," J. Nucl. Mater., vol. 307-311, pp. 988-992, 2002.
-
(2002)
J. Nucl. Mater.
, vol.307-311
, pp. 988-992
-
-
Schaeublin, R.1
Catula, M.-J.2
Wall, M.3
Felter, T.4
Fluss, M.5
Wirth, B.D.6
De La Rubia, T.D.7
Victoria, M.8
-
34
-
-
0031379688
-
Defects and diffusion in silicon processing
-
G. D. Watkins, "Defects and diffusion in silicon processing," in Proc. MRS Symp., vol. 469, 1997, p. 139.
-
(1997)
Proc. MRS Symp.
, vol.469
, pp. 139
-
-
Watkins, G.D.1
-
35
-
-
11344283833
-
Heat spike effect on the straggling of cluster implants
-
July
-
J. Peltola, "Heat spike effect on the straggling of cluster implants," Phys. Rev. B, vol. 68, p. 5419, July 2003.
-
(2003)
Phys. Rev. B
, vol.68
, pp. 5419
-
-
Peltola, J.1
|