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Volumn 307-311, Issue 2 SUPPL., 2002, Pages 988-992

Correlating TEM images of damage in irradiated materials to molecular dynamics simulations

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPUTER SIMULATION; EXTRAPOLATION; IRRADIATION; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036952854     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(02)01140-6     Document Type: Article
Times cited : (11)

References (17)
  • 2
    • 0000907953 scopus 로고    scopus 로고
    • Electron microscopy 1998
    • H.A. Calderón Benavides, Yacamán M.J., Cancun (Mexico) (31.8-4.9.1998), Bristol and Philadelphia: Institute of Physics Publishing
    • Schäublin R., Dai Y., Victoria M. Electron Microscopy 1998. Calderón Benavides H.A., Yacamán M.J. Proceedings of the 14th International Congress on Electron Microscopy, Cancun (Mexico) (31.8-4.9.1998). vol. I:1998;173 Institute of Physics Publishing, Bristol and Philadelphia.
    • (1998) Proceedings of the 14th International Congress on Electron Microscopy , vol.1 , pp. 173
    • Schäublin, R.1    Dai, Y.2    Victoria, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.