Irradiation experiments with high-voltage power devices as a possible means to predict failure rates due to cosmic rays

IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD)

Volumn , Issue , 1997, Pages 169-172

  Voss, Peter ^a   Maier, K H ^a   Meczynski, W ^a   Becker, H W ^a   Normand, Eugene ^a   Wert, Jerry L ^a   Oberg, Dennis I ^a   Majewski, Peter P ^a  

^a eupec   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; COSMIC RAYS; FAILURE ANALYSIS; IONS; NEUTRON IRRADIATION; RADIATION EFFECTS; SEMICONDUCTOR JUNCTIONS;

COSMIC RAY INDUCED FAILURES; HIGH VOLTAGE POWER DEVICES;

SEMICONDUCTOR DIODES;

EID: 0030674986     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)