Broadening of the variance of the number of upsets in a read-cycle by MBUs

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 II, 2004, Pages 3701-3707

  Chugg, A M ^a   Moutrie, M J ^a   Jones, R ^a  

^a Radiation Effects Group   (United Kingdom)

Author keywords

Multiple bit upsets (MBUs); Single event effects (SEE); Single word multiple bit upsets (SMUs)

Indexed keywords

CHARGE COUPLED DEVICES; DATA REDUCTION; IMAGE ANALYSIS; NEUTRONS; OPTICAL RESOLVING POWER; PROBABILITY DISTRIBUTIONS; RADIATION EFFECTS; VARIATIONAL TECHNIQUES;

MULTIPLE BIT UPSETS (MBU); READ-CYCLE; SINGLE EVENT EFFECTS (SEE); SINGLE-WORD MULTIPLE-BIT UPSETS (SMU);

ELECTRONIC EQUIPMENT TESTING;

EID: 11044222681     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839248     Document Type: Conference Paper

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