Analyses of CCD images of nucleon-silicon interaction events

IEEE Transactions on Nuclear Science

Volumn 51, Issue 5 III, 2004, Pages 2851-2856

  Chugg, A M ^a   Jones, R ^a   Moutrie, M J ^a   Dyer, C S ^b   Ryden, K A ^b   Truscott, P R ^b   Armstrong, J R ^c   King, D B S ^c  

^a Radiation Effects Group   (United Kingdom)

^b QINETIQ   (United Kingdom)

^c BAE SYSTEMS   (United Kingdom)

Author keywords

Active pixel sensor (APS); Charge collection efficiency; Charge coupled device (CCD); GEANT4; Neutron interactions; Particle tracks; Transient events

Indexed keywords

CHARGE COUPLED DEVICES; CODES (SYMBOLS); COMPUTER SIMULATION; MATHEMATICAL MODELS; NEUTRON BEAMS; NEUTRON IRRADIATION; PROTONS; QUANTUM EFFICIENCY; RADIATION DETECTORS; SENSORS;

ACTIVE PIXEL SENSORS (APS); CHARGE COLLECTION EFFICIENCY; GEANT4; NEUTRON INTERACTIONS; PARTICLE TRACKS; TRANSIENT EVENTS;

IMAGE ANALYSIS;

EID: 8344263225     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.835113     Document Type: Article

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