New Monte Carlo calculations of charged particle track-structure in silicon

IEEE Transactions on Nuclear Science

Volumn 51, Issue 5 III, 2004, Pages 2872-2879

  Emfietzoglou, D ^a   Akkerman, A ^b   Barak, J ^b  

^a UNIVERSITY OF IOANNINA   (Greece)

^b SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

Dielectric response theory; Dose radial distribution; Inelastic atomic ion scattering; Ion induced prompt electric field; Straggling

Indexed keywords

COMPUTER SIMULATION; COSMIC RAYS; ELECTRIC FIELDS; ELECTRONS; ENERGY TRANSFER; MATHEMATICAL MODELS; MONTE CARLO METHODS; PROBABILITY;

DIELECTRIC RESPONSE THEORY; DOSE RADIAL DISTRIBUTION; INELASTIC ATOMIC ION SCATTERING; ION-INDUCED PROMPT ELECTRIC FIELD; STRAGGLING;

SILICON;

EID: 8344252095     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.835061     Document Type: Article

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