Two-dimensional planar size effects in epitaxial PbTiO3 thin films

Applied Physics Letters

Volumn 85, Issue 20, 2004, Pages 4711-4713

  Lee, Kilho ^a   Kim, Keewon ^a   Kwon, Soon Ju ^a   Baik, Sunggi ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; FINITE ELEMENT METHOD; LEAD COMPOUNDS; LITHOGRAPHY; STRAIN;

COMPRESSIVE STRAIN; MISFIT STRAIN; PLANAR SIZE; SPACE MAPPING;

THIN FILMS;

EID: 10944229043     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1823033     Document Type: Article

References (17)

1. O. Auciello, J. F. Scott, and R. Ramesh, Phys. Today 51, 22 (1998).
2. A. L. Roytburd, S. P. Alpay, V. Nagarajan, C. S. Ganpule, S. Aggarwal, E. D. Williams, and R. Ramesh, Phys. Rev. Lett. 85, 190 (2000).
3. T. M. Shaw, S. Trolier-McKinstry, and P. C. McIntyre, Annu. Rev. Mater. Sci. 30, 263 (2000).
4. Y. G. Wang, W. L. Zhong, and P. L. Zhang, Phys. Rev. B 51, 17235 (1995).
5. V. Nagarajan, A. L. Roytburd, A. Stanishevsky, S. Prasertchoung, T. Zhao, L. Chen, J. Melngailis. O. Auciello, and R. Ramesh, Nat. Mater. 2, 43 (2003).
6. C. S. Ganpule, A. Stanishevsky, Q. Su, S. Aggarwal, J. Melngailis, E. Williams, and R. Ramesh, Appl. Phys. Lett. 75, 409 (1999).
7. S. Bühlmann, B. Dwir, J. Baborowski, and P. Muralt, Appl. Phys. Lett. 80, 3195 (2002).
8. M. Alexe, C. Harnagea, W. Erfurth, D. Hesse, and U. Gosele, Appl. Phys. A: Mater. Sci. Process. 70, 247 (2000).
9. M. Hiratani, C. Okazaki, H. Hasegawa, N. Sugii, Y. Tarutani, and K. Takagi, Jpn. J. Appl. Phys., Part 1 36, 5219 (1997).
10. K. S. Lee, J. H. Choi, J. Y. Lee, and S. Baik, J. Appl. Phys. 90, 4095 (2001).
11. J. S. Speck and W. Pompe, J. Appl. Phys. 76, 466 (1994).
12. N. A. Pertsev and A. G. Zembilgotov, J. Appl. Phys. 80, 6401 (1996).
13. S. P. Alpay and A. L. Roytburd, J. Appl. Phys. 83, 4714 (1998).
14. K. Lee, K. S. Lee, and S. Baik, J. Appl. Phys. 90, 6327 (2001).
15. Y. K. Kim, K. Lee, and S. Baik, J. Appl. Phys. 95, 236 (2004).
16. K. S. Lee and S. Baik, J. Appl. Phys. 85, 1995 (1999).
17. K. Lee, K. S. Lee, Y. K. Kim, and S. Baik, Integr. Ferroelectr. 46, 307 (2002).