Measurement of interface potential change and space charge region across metal/organic/metal structures using Kelvin probe force microscopy

Applied Physics Letters

Volumn 85, Issue 18, 2004, Pages 4148-4150

  Tal, O ^a   Gao, W ^b,c   Chan, C K ^b   Kahn, A ^b   Rosenwaks, Y ^a  

^a TEL AVIV UNIVERSITY   (Israel)

^b Princeton University   (United States)

^c DUPONT COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

KELVIN PROBE FORCE MICROSCOPY; METAL STRUCTURES; POTENTIAL DISTRIBUTION; SPACE CHARGE REGIONS;

ALUMINUM COMPOUNDS; ELECTRIC SPACE CHARGE; EVAPORATION; GOLD; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; PURIFICATION;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 10044257814     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1811805     Document Type: Article

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