Effective phase correction function for high-resolution exit wave reconstruction by a three-dimensional Fourier filtering method

Ultramicroscopy

Volumn 102, Issue 2, 2005, Pages 127-139

  Kawasaki, T ^a,b   Taya, M ^a   Nomaguchi, T ^a   Takai, Y ^a  

^a OSAKA UNIVERSITY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

Exit wave reconstruction; High resolution transmission electron microscopy; Illumination divergence correction; Spherical aberration correction; Three dimensional Fourier filtering method

Indexed keywords

EXIT WAVE RECONSTRUCTION; LENS ABERRATIONS; THREE DIMENSIONAL FOURIER FILTERING METHOD (3D-FFM);

ABERRATIONS; AMORPHOUS FILMS; COMPUTER SIMULATION; FOURIER TRANSFORMS; IMAGE RECONSTRUCTION; OPTICAL RESOLVING POWER; THIN FILMS; THREE DIMENSIONAL;

OPTICAL INSTRUMENT LENSES;

SILICON;

ACCURACY; ARTICLE; CONTRAST; FILM; FILTRATION; FOURIER ANALYSIS; ILLUMINATION; IMAGING; INTERMETHOD COMPARISON; MATHEMATICAL ANALYSIS; STATISTICAL SIGNIFICANCE; STRUCTURE ANALYSIS; THREE DIMENSIONAL IMAGING; WAVEFORM;

FOURIER ANALYSIS; IMAGE PROCESSING, COMPUTER-ASSISTED; LIGHTING; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, THEORETICAL;

EID: 10044243390     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.09.004     Document Type: Article

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