Practical method to determine the filter shape function used in the three-dimensional Fourier filtering method

Journal of Electron Microscopy

Volumn 53, Issue 3, 2004, Pages 271-275

  Kawasaki, Tadahiro ^a,b   Taya, Masaki ^a   Takai, Yoshizo ^a  

^a OSAKA UNIVERSITY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

Artefact free; Exit wave reconstruction; Filter shape function; High signal to noise ratio; High resolution transmission electron microscopy; Three dimensional Fourier spectrum

Indexed keywords

CARBON NANOTUBE; GOLD;

ALGORITHM; ARTICLE; CHEMISTRY; ELECTRON MICROSCOPY; FOURIER ANALYSIS; IMAGE PROCESSING; METHODOLOGY;

ALGORITHMS; FOURIER ANALYSIS; GOLD; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON; NANOTUBES, CARBON;

BANDPASS FILTERS; CARBON NANOTUBES; DAMPING; FOURIER TRANSFORMS; SIGNAL RECONSTRUCTION; SIGNAL TO NOISE RATIO; YARN;

ARTIFACT-FREE; EXIT WAVES; EXIT-WAVE RECONSTRUCTION; FILTER SHAPE FUNCTION; FOURIER SPECTRA; HIGH SIGNAL-TO-NOISE RATIO; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SHAPE FUNCTIONS; THREE-DIMENSIONAL FOURIER SPECTRUM; WAVE RECONSTRUCTION;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 3242883447     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/53.3.271     Document Type: Article

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