Roughness-induced piezoelectric scattering in lattice-mismatched semiconductor quantum wells

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 19, 2003, Pages

  Quang, Doan ^a   Tuoc, Vu ^b   Huan, Tran ^c  

^a OSAKA UNIVERSITY   (Japan)

^b UNIVERSITY OF PADERBORN   (Germany)

^c HANOI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Viet Nam)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY; GALLIUM ARSENIDE; INDIUM; INDIUM GALLIUM ARSENIDE; NITRIDE; NITROGEN DERIVATIVE; SILICON; SILICON DIOXIDE; UNCLASSIFIED DRUG; ZINC;

ARTICLE; CALCULATION; CORRELATION FUNCTION; DEVICE; ELECTRON; LOW TEMPERATURE; PIEZOELECTRICITY; QUANTUM MECHANICS; ROUGHNESS; SEMICONDUCTOR; SURFACE PROPERTY; THEORY;

EID: 10044229947     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.195316     Document Type: Article

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