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Volumn 54, Issue 23, 1996, Pages 16799-16812
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Deep-level transient spectroscopy study of narrow SiGe quantum wells with high Ge content
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0011182347
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.54.16799 Document Type: Article |
Times cited : (30)
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References (26)
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