X-ray diffraction and photoelectron spectroscopic studies of (001)-oriented Pb(Zr0.52Ti0.48)O3 thin films prepared by laser ablation

Journal of Applied Physics

Volumn 95, Issue 1, 2004, Pages 241-247

  Zhu, T J ^a   Lu, Li ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRYSTALLOGRAPHY; FILM PREPARATION; HETEROJUNCTIONS; LASER ABLATION; LATTICE CONSTANTS; PULSED LASER DEPOSITION; SINGLE CRYSTALS; STOICHIOMETRY; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC SENSITIVITY FACTOR METHODS; CHEMICAL STATES; ION SPUTTERING;

LEAD COMPOUNDS;

EID: 0942300834     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1631750     Document Type: Article

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