메뉴 건너뛰기




Volumn 138-139, Issue 1-4, 1999, Pages 552-556

An XPS and XRD study of physical and chemical homogeneity of Pb(Zr,Ti)O 3 thin films obtained by pulsed laser deposition

Author keywords

Chemical homogeneity; Pb(Zr,Ti)O 3 thin films; Physical homogeneity

Indexed keywords


EID: 0012486260     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00577-7     Document Type: Article
Times cited : (29)

References (11)
  • 10
  • 11
    • 0000503141 scopus 로고
    • Auger and X-ray photoelectron spectroscopy
    • Wiley, New York
    • D. Briggs, M.P. Seah (Eds.), Auger and X-ray photoelectron spectroscopy, in: Practical Surface Analysis, 2nd edn., Vol. 1, Wiley, New York, 1990.
    • (1990) Practical Surface Analysis, 2nd Edn. , vol.1
    • Briggs, D.1    Seah, M.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.