XPS study of the nucleation and growth behavior of an epitaxial Pb(Zr,Ti)O3/MgO(100) thin film prepared by MOCVD

Thin Solid Films

Volumn 372, Issue 1, 2000, Pages 156-162

  Wakiya, Naoki ^a   Kuroyanagi, Kazumasa ^a   Xuan, Yi ^a   Shinozaki, Kazuo ^a   Mizutani, Nobuyasu ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CRYSTAL GROWTH; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; MAGNESIA; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NUCLEATION; STOICHIOMETRY; SUBSTRATES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

LEAD ZIRCONIUM TITANATE;

DIELECTRIC FILMS;

EID: 0034274596     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01013-0     Document Type: Article

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