Nucleation and growth behavior of epitaxial Pb(Zr,Ti)O3/MgO(100) observed by atomic force microscopy

Thin Solid Films

Volumn 357, Issue 2, 1999, Pages 166-172

  Wakiya, Naoki ^a   Kuroyanagi, Kazumasa ^a   Xuan, Yi ^a   Shinozaki, Kazuo ^a   Mizutani, Nobuyasu ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; FILM GROWTH; GRAIN SIZE AND SHAPE; LEAD COMPOUNDS; MAGNESIA; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MONOLAYERS; NUCLEATION; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

MONODISPERSED GRAIN SIZE DISTRIBUTION;

DIELECTRIC FILMS;

EID: 0033346947     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00642-2     Document Type: Article

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