Dense electronic excitation induced defects in fused silica

Journal of Physics D: Applied Physics

Volumn 36, Issue 24, 2003, Pages 3151-3155

  Mohanty, T ^a   Mishra, N C ^b   Bhat, S V ^c   Basu, P K ^d   Kanjilal, D ^a  

^a INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^b UTKAL UNIVERSITY   (India)

^c INDIAN INSTITUTE OF SCIENCE   (India)

^d SOLID STATE PHYSICS LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; DEFECTS; ELECTRONIC DENSITY OF STATES; EMISSION SPECTROSCOPY; IONS; IRRADIATION; OPTICAL PROPERTIES; PARAMAGNETIC RESONANCE; PARAMAGNETISM; PHOTOLUMINESCENCE; SILVER; ULTRAVIOLET SPECTROSCOPY;

DENSE ELECTRONIC EXCITATION; OPTICAL GRADE; OXYGEN VACANCIES;

FUSED SILICA;

EID: 0347949804     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/24/010     Document Type: Article

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