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Volumn 157, Issue 6-12, 2002, Pages 575-581

Radiation induced defects in SiO2

Author keywords

Cathodoluminescence; Defect luminescence; Defect transformation; Excitation dose; Mobile oxygen

Indexed keywords

CATHODOLUMINESCENCE; ION IMPLANTATION; OXYGEN; RADIATION DAMAGE; SILICA; ULTRAVIOLET RADIATION;

EID: 0346758862     PISSN: 10420150     EISSN: 10294953     Source Type: Journal    
DOI: 10.1080/10420150215756     Document Type: Article
Times cited : (17)

References (17)
  • 14
    • 28244464727 scopus 로고    scopus 로고
    • 2:O layers, Research Center Rossendorf 2000
    • 2:O layers, Research Center Rossendorf 2000.
    • (1997) 2: Ge Layers
    • Schmidt, B.1
  • 15
    • 0002026939 scopus 로고    scopus 로고
    • Pacchioni, G., Skuja, L. and Griscom, D. L. (Eds.), NATO Science Series. Kluwer Academic Publishers, Dordrecht, Boston, London
    • 2 and Related Dielectrics: Science and Technology, NATO Science Series. Kluwer Academic Publishers, Dordrecht, Boston, London, pp. 117-159.
    • (2000) 2 and Related Dielectrics: Science and Technology , pp. 117-159
    • Griscom, D.L.1
  • 17
    • 0003105404 scopus 로고    scopus 로고
    • Pacchioni, G., Skuja, L. and Griscom, D. L. (Eds.), NATO Science Series. Kluwer Academic Publishers, Dordrecht, Boston, London
    • 2 and Related Dielectrics: Science and Technology, NATO Science Series. Kluwer Academic Publishers, Dordrecht, Boston, London, pp. 73-116.
    • (2000) 2 and Related Dielectrics: Science and Technology , pp. 73-116
    • Skuja, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.