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Volumn 50, Issue 1-3, 1997, Pages 76-81
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Characterisation of dislocations, nanopipes and inversion domains in GaN by transmission electron microscopy
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Author keywords
Dislocations; GaN; Transmission electron microscopy
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Indexed keywords
DISLOCATIONS (CRYSTALS);
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
SEMICONDUCTING FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
CONVERGENCE BEAM ELECTRON DIFFRACTION (CBED);
INVERSION DOMAIN BOUNDARIES (IDB);
SEMICONDUCTING GALLIUM COMPOUNDS;
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EID: 0347877213
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(97)00171-2 Document Type: Article |
Times cited : (38)
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References (21)
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