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Volumn 50, Issue 1-3, 1997, Pages 76-81

Characterisation of dislocations, nanopipes and inversion domains in GaN by transmission electron microscopy

Author keywords

Dislocations; GaN; Transmission electron microscopy

Indexed keywords

DISLOCATIONS (CRYSTALS); METALLORGANIC CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING FILMS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0347877213     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(97)00171-2     Document Type: Article
Times cited : (38)

References (21)
  • 19
    • 0346470897 scopus 로고    scopus 로고
    • PhD thesis, University of Bristol, UK
    • W.T. Young, PhD thesis, University of Bristol, UK, 1996.
    • (1996)
    • Young, W.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.