Nanopipes and inversion domains in high-quality GaN epitaxial layers

Materials Research Society Symposium - Proceedings

Volumn 449, Issue , 1997, Pages 405-410

  Ponce, F A ^a   Young, W T ^a   Cherns, D ^a   Steeds, J W ^a   Nakamura, S ^a  

^a PALO ALTO RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; MICROSCOPIC EXAMINATION; NITRIDES; SEMICONDUCTING GALLIUM COMPOUNDS;

CORELESS DISLOCATIONS; GALLIUM NITRIDE; NANOPIPES;

SEMICONDUCTING FILMS;

EID: 0030679048     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)