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Volumn 229, Issue 1-6, 2004, Pages 109-116

Fabrication of high-efficiency multilayer-coated gratings for the EUV regime using e-beam patterned substrates

Author keywords

Blazed grating; Diffractive optics; Electron beam lithography; Extreme ultraviolet; Multilayer coating

Indexed keywords

ANNEALING; APPROXIMATION THEORY; BACKSCATTERING; DIFFRACTIVE OPTICS; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTRON BEAM LITHOGRAPHY; LIGHT MODULATION; LIGHT REFLECTION; MICROELECTRONIC PROCESSING; MULTILAYERS; OPTICAL COATINGS; SILICON WAFERS; SUBSTRATES; SURFACE ROUGHNESS; ULTRAVIOLET RADIATION; X RAYS;

EID: 0347593748     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2003.11.005     Document Type: Article
Times cited : (23)

References (26)
  • 17
  • 21
    • 0942267518 scopus 로고    scopus 로고
    • Nanoscale topography control for the fabrication of advanced diffractive optics
    • to be published
    • J.A. Liddle, F. Salmassi, P. Naulleau, E. Gullikson, Nanoscale topography control for the fabrication of advanced diffractive optics, J. Vac. Sci. Technol. B, to be published (2003).
    • (2003) J. Vac. Sci. Technol. B
    • Liddle, J.A.1    Salmassi, F.2    Naulleau, P.3    Gullikson, E.4
  • 26
    • 0347350791 scopus 로고    scopus 로고
    • Center for X-Ray Optics web site: < http://www-cxro.lbl.gov/optical_constants/ >.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.