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Volumn 694, Issue , 1998, Pages 252-265

Quantitative Probing in Atomic Force Microscopy of polymer Surfaces

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0347174919     PISSN: 00976156     EISSN: None     Source Type: Book Series    
DOI: 10.1021/bk-1998-0694.ch015     Document Type: Article
Times cited : (10)

References (41)
  • 4
    • 0346117857 scopus 로고    scopus 로고
    • Tsukruk, V. V., Rubber Chem.&Techn., 1997, accepted; Bliznyuk, V. N.; Everson., M., Tsukruk, V. V.; J. Tribology, 1996, submitted.
    • (1997) Rubber Chem.&Techn.
    • Tsukruk, V.V.1
  • 14
    • 0347377975 scopus 로고    scopus 로고
    • personal communication
    • Cleveland, J. P., personal communication.
    • Cleveland, J.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.