Scanning probe microscopy of organics, an update

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 112-115

  Frommer, Jane E ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

Atomic force microscopy; Monolayers; Organic substances; Surface properties

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; BONDING; DELAMINATION; ELASTICITY; FRICTION; GEOMETRY; INTERFACES (MATERIALS); MOLECULAR DYNAMICS; MONOLAYERS; PROBES; SURFACE PROPERTIES;

BIO SPECIFICITY; INDIVIDUAL BONDING INTERACTIONS; MULTIBODY INTERACTIONS; QUANTIFICATION; SCANNING PROBE MICROSCOPY; UNCERTAINTIES;

ORGANIC COMPOUNDS;

EID: 0030079860     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06997-6     Document Type: Article

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