Are measured values of the Auger parameter always independent of charging effects?

Surface and Interface Analysis

Volumn 35, Issue 12, 2003, Pages 991-997

  Oswald, S ^a   Gonzalez Elipe A R ^b   Reiche, R ^a   Espinos, J P ^b   Martin A ^b  

^a IFW DRESDEN   (Germany)

^b INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

Author keywords

Auger parameter; Charging; Interfaces; Oxide; XPS

Indexed keywords

BINDING ENERGY; DEPOSITION; ELECTRIC EXCITATION; ELECTRIC INSULATORS; ELECTRON GUNS; ELECTRONIC PROPERTIES; FLOODLIGHTING; GOLD; KINETIC ENERGY; MONOCHROMATORS; OPTIMIZATION; PHOTOEMISSION; SPECTROMETERS; TIN COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHARGING EFFECTS; DIFFERENTIAL CHARGING PHENOMENON;

AUGER ELECTRON SPECTROSCOPY;

EID: 0345763244     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1636     Document Type: Article

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