Charge compensation and binding energy referencing in XPS analysis

Surface and Interface Analysis

Volumn 27, Issue 12, 1999, Pages 1069-1072

  Metson, J B ^a  

^a UNIVERSITY OF AUCKLAND   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; SURFACE PHENOMENA;

SURFACE CHARGING;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0033357440     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199912)27:12<1069::aid-sia677>3.0.co;2-a     Document Type: Article

References (13)

1. Briggs D, Seah MP. (eds). Practical Surface Analysis (2nd edn), vol. 1. Wiley: Chichester, 1990.
2. Moulder JF, Stickle WF, Sobol PE, Bomben KD. Handbook of X-ray Photoelectron Spectroscopy. Physical Electronics: Eden Prairie, MN, 1992.
3. Watts JF. Surface Science Techniques, Walls JM, Smith R (eds). Pergamon Press: New York.
4. Bryson III CE. Surf. Sci. 1987; 189/190: 50-58.
5. Clark DT, Brennan WJ. J. Electron Spectros. Relat. Phenom. 1988; 47: 93.
6. Barth G, Linder R, Bryson CE. Surf. Interface Anal. 1988; 11: 307.
7. Walker AR. European Patent Specification 0 243 060 B1, US Patent No. 4,810,879.
8. Coxon P. European Patent Application 0 617 452 A1.
9. Figures from US Patent No. 5,286,974.
10. Moulder JF, Hooks D. PHI Interface 1997; 17: No. 1.
11. Swift P. Surf. Interface Anal. 1982; 4: 47.
12. Wagner CD. Farad. Discuss. Chem. Soc. 1975; 60: 291.
13. Wagner CD, Gale LH, Raymond RH. Anal. Chem. 1979; 51: 466.