Differential charging in XPS. Part I: Demonstration of lateral charging in a bulk insulator using imaging XPS

Surface and Interface Analysis

Volumn 24, Issue 1, 1996, Pages 28-33

  Tielsch, Brian J ^a   Fulghum, Julia E ^a  

^a KENT STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; ELECTRONS; IMAGING TECHNIQUES; INSULATING MATERIALS; SURFACE PHENOMENA; X RAYS;

BULK INSULATORS; CHARGE SHIFTS; LATERAL DIFFERENTIAL CHARGING; MONOCHROMATIC X RAY SOURCE; SMALL AREA SPECTRA; VERTICAL DIFFERENTIAL CHARGING;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0029772247     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199601)24:1<28::AID-SIA66>3.0.CO;2-G     Document Type: Article

References (5)

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4. J. Cazaux and P. Leheude, J. Electron Spectrosc. Relat. Phenom. 59, 49 (1992).
5. P. Swift, D. Shuttleworth and M. P. Seah, in Practical Surface Analysis, ed. by D. Briggs and M. P. Seah, Appendix 2 Wiley, Chichester (1990).