Structural and ferroelectric properties of europium doped lead zirconate titanate thin films by a sol-gel method

Thin Solid Films

Volumn 424, Issue 2, 2003, Pages 161-164

  Yu, Yan Ju ^a,b   Chan, H L W ^b   Wang, Fu Ping ^a   Li, Kun ^b   Choy, C L ^b   Zhao, Lian Cheng ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

Dielectrics; Ferroelectric properties; PZT thin films; Rare earth dopant; Sol gel process

Indexed keywords

COERCIVE FORCE; ELECTRIC IMPEDANCE; ELECTROMAGNETIC WAVE POLARIZATION; EUROPIUM; FERROELECTRICITY; PERMITTIVITY; PEROVSKITE; PYROLYSIS; REMANENCE; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTOR DOPING; SOL-GELS; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC PROPERTIES;

FERROELECTRIC THIN FILMS;

EID: 0345487413     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)01052-0     Document Type: Article

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