Oxide electrodes as barriers to hydrogen damage of Pb(Zr,Ti)O3-based ferroelectric capacitors

Applied Physics Letters

Volumn 74, Issue 20, 1999, Pages 3023-3025

  Aggarwal, S ^a   Perusse, S R ^a   Nagaraj, B ^a   Ramesh, R ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIELECTRIC FILMS; ELECTROCHEMICAL ELECTRODES; FERROELECTRIC DEVICES; FERROELECTRICITY; HYDROGEN; LANTHANUM COMPOUNDS; LEAD COMPOUNDS; POLARIZATION; STRONTIUM COMPOUNDS;

FERROELECTRIC CAPACITORS; FORMING GAS ANNEALS (FGA);

CAPACITORS;

EID: 0032620388     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124052     Document Type: Article

References (6)

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