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Volumn 42, Issue 10 A, 2003, Pages
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Nanocrystalline Silicon Dots Fabricated by Pulse RF Plasma-Enhanced Chemical Vapor Deposition of SiCl4-and-H2 Mixture
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Author keywords
nc Si; Photoluminescence; Pulse discharge; rf plasma CVD; SiCl4
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DENSITY (OPTICAL);
ELLIPSOMETRY;
LOW TEMPERATURE EFFECTS;
PHOTOLUMINESCENCE;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
PULSE MODULATION;
SILICON;
SPECTROSCOPIC ANALYSIS;
SUBSTRATES;
TRANSMISSION ELECTRON MICROSCOPY;
VOLUME FRACTION;
PULSE DISCHARGES;
SPECTROSCOPIC ELLIPSOMETRY;
NANOSTRUCTURED MATERIALS;
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EID: 0344272226
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.42.l1191 Document Type: Article |
Times cited : (6)
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References (19)
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