Effect of AIN buffer layer on the growth of InN epitaxial film on Si substrate

Physica Status Solidi (B) Basic Research

Volumn 240, Issue 2, 2003, Pages 429-432

  Yamaguchi, T ^a   Saito, Y ^a   Morioka, C ^a   Yorozu, K ^a   Araki, T ^a   Suzuki, A ^a   Nanishi, Y ^a  

^a RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344064254     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200303404     Document Type: Conference Paper

References (14)

1. V. Y. Davydov, A. A. Klochikhin, R. P. Seisyan, V. V. Emtsev, S. V. Ivanov, F. Bechstedt, J. Furthmüller, H. Harima, A. V. Mudryi, J. Adrhold, O. Semchinova, and J. Graul, phys. stat. sol. (b) 229, R1 (2002).
2. T. Matsuoka, H. Okamoto, M. Nakao, H. Harima, and E. Kurimoto, Appl. Phys. Lett. 81, 1246 (2002).
3. J. Wu, W. Walukiewicz, K. M. Yu, J. W. Arger III, E. E. Haller, H. Lu, W. J. Schaff, Y. Saito, and Y. Nanishi, Appl. Phys. Lett. 80, 3967 (2002).
4. Y. Saito, H. Harima, E. Kurimoto, T. Yamaguchi, N. Teraguchi, A. Suzuki, T. Araki, and Y. Nanishi, phys. stat. sol. (b) 234, 796 (2002).
5. K. Osamura, K. Nakajima, and Y. Murakami, Solid State Commun. 11, 617 (1972).
6. T. L. Tansley and C. P. Foley, J. Appl. Phys. 59, 3241 (1986).
7. T. Yamaguchi, K. Mizuo, Y. Saito, T. Araki, Y. Nanishi, and T. Miyajima, Int. Symp. Comp. Semicond., Lausanne, Switzerland, 7-10 Oct., Mo-P-7 (2002), Inst. Phys. Conf. Ser. 174, 17 (2003).
8. A. Yamamoto, M. Tsujino, M. Ohkubo, and A. Hashimoto, J. Cryst. Growth 137, 415 (1994).
9. T. Yodo, H. Yona, H. Ando, D. Nosei, and Y. Harada, Appl. Phys. Lett. 80, 968 (2002).
10. T. Yamaguchi, K. Mizuo, Y. Saito, T. Noguchi, T. Araki, Y. Nanishi, T. Miyajima, and Y. Kudo, Mater. Res. Soc. Symp. Proc. 743, L3.26 (2003).
11. Y. Saito, N. Teraguchi, A. Suzuki, T. Araki, and Y. Nanishi, Jpn. J. Appl. Phys. 40, L91 (2001).
12. Y. Nakada, I. Aksenov, and H. Okumura, Appl. Phys. Lett. 73, 827 (1998).
13. T. Yamaguchi, Y. Saito, T. Araki, A. Suzuki, and Y. Nanishi, Extended Abstract of 2003 IMFEDK, Osaka, Japan, 16-18 Jul., P-4 (2003).
14. Y. Nanishi, Y. Saito, and T. Yamaguchi, Jpn. Appl. Phys. 42, 2549 (2003).