Review of reliability issues of metal-semiconductor-metal and avalanche photodiode photonic detectors

Microelectronics Reliability

Volumn 39, Issue 12, 1999, Pages 1873-1883

  Brennan, Kevin F ^a   Haralson II, Joe ^a   Parks Jr , Joseph W ^b   Salem, Ali ^c  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b INTEL CORPORATION   (United States)

^c Rockwell Semiconductor Systems ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343700576     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(99)00197-3     Document Type: Review

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