|
Volumn 177, Issue 2, 2000, Pages 485-493
|
Hexagonal GaN epitaxial growth on Si(111) by a vacuum reaction method
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CARRIER CONCENTRATION;
CARRIER MOBILITY;
CRYSTAL ORIENTATION;
CRYSTALLINE MATERIALS;
EPITAXIAL GROWTH;
FILM GROWTH;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTOR DOPING;
SEMICONDUCTOR GROWTH;
SILICON WAFERS;
SINGLE CRYSTALS;
BUFFER LAYERS;
GALLIUM NITRIDE;
MICROCRYSTALLINE MATERIALS;
VACUUM REACTION METHOD;
SEMICONDUCTING FILMS;
|
EID: 0342756827
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-396X(200002)177:2<485::AID-PSSA485>3.0.CO;2-7 Document Type: Article |
Times cited : (4)
|
References (13)
|