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Volumn 83, Issue 5, 1998, Pages 2796-2799

Study of defects in GaN films by cross-sectional cathodoluminescence

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EID: 0342477447 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.366634 Document Type: Article

Times cited : (24)

References (12)

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