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Volumn 260, Issue 1-2, 2004, Pages 148-158

Improvement in crystalline quality of Cd1-xZnxTe(x = 4 %) crystals grown in graphite crucible

Author keywords

A1. High resolution X ray diffraction; A2. Bridgman growth; B2. Semiconducting cadmium compounds

Indexed keywords

ANNEALING; CRYSTAL GROWTH; CRYSTALLINE MATERIALS; GRAPHITE; LIGHT TRANSMISSION; X RAY DIFFRACTION ANALYSIS;

EID: 0242439538     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2003.08.018     Document Type: Article
Times cited : (25)

References (38)
  • 1
    • 0004095824 scopus 로고
    • Semiconductors and semimetals
    • R.K. Willardson, Beer New York: Academic Press
    • Zanio K. Semiconductors and semimetals. Willardson R.K., Beer Cadmium Telluride. Vol. 13:1978;Academic Press, New York.
    • (1978) Cadmium Telluride , vol.13
    • Zanio, K.1
  • 2
    • 0003701341 scopus 로고    scopus 로고
    • Properties of Narrow Gap Cadmium Based Compounds
    • INSPEC, London, UK, and references therein
    • P. Capper (Ed.), Properties of Narrow Gap Cadmium Based Compounds, EMIS Data Reviews Series No. 10 INSPEC, London, UK, pp. 365-603, and references therein.
    • EMIS Data Reviews Series No. 10 , vol.10 , pp. 365-603
    • Capper, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.