Progress in CdZnTe substrate producibility and critical drivers of IRFPA yield originating with CdZnTe substrates

Journal of Electronic Materials

Volumn 27, Issue 6, 1998, Pages 564-572

  Price, S L ^a   Hettich, H L ^a   Sen, S ^a   Currie, M C ^a   Rhiger, D R ^a   Mc Lean, E O ^a  

^a Santa Barbara Research Center   (United States)

Author keywords

CdZnTe; Cross hatch; Defects; Infrared focal plane array (IRFPA); Liquid phase epitaxy (LPE)

Indexed keywords

EID: 0041482129     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-998-0016-4     Document Type: Article

References (3)

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3. S.P. Tobin, F.T.J. Smith, P.W. Norton, J. Wu, M. Dudley, D. DiMarzio and L.G. Casagrande, J. Electron. Mater. 24, 1189 (1995).