Quality assessment of Bridgman-grown CdTe single crystals using double-crystal X-ray diffractometry (DCD) and synchrotron radiation

Journal of Crystal Growth

Volumn 210, Issue 1, 2000, Pages 193-197

  Kumaresan, R ^a,b   Gopalakrishnan, R ^b,c   Moorthy Babu, S ^b   Ramasamy, P ^b   Zaumseil, Peter ^d   Ichimura, Masaya ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^b ANNA UNIVERSITY   (India)

^c ELECTROTECHNICAL LABORATORY   (Japan)

^d IHP   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; SINGLE CRYSTALS; SYNCHROTRON RADIATION; X RAY CRYSTALLOGRAPHY;

DOUBLE-CRYSTAL X-RAY DIFFRACTOMETRY (DCD);

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0033896045     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00677-6     Document Type: Article

References (5)

1. Liaw Ing-Ruey, Chou Kan-Sen, Chang Shih-Lin J. Cryst. Growth. 100:1990;508.
2. Dutt B.V., Mahajan S., Roedel R.J., Schwartz G.P., Miller D.C., Derick L. J. Electrochem. Soc. 128:1981;1573.
3. Tuomi T., Lipsanen H., Ranta-Aho T., Partanen J. J. Cryst. Growth. 96:1989;8881.
4. Lay K.Y., Nichols D., McDevitt S., Dean B.E., Johnson C.J. J. Cryst. Growth. 86:1988;118.
5. Song Wen-Bin, Yu Mei-Yun, Wu Wen-Hai, J. Cryst. Growth 86 (1988) 127.